This document defines consistent methodologies for computation of in-process defects per million opportunities (DPMO) metrics for any evaluation stage in the assembly process. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912. A guide to defect categorization is provided that can serve as a base for summarizing and reporting in-process defects when used with J-STD-001 and IPC-A-610. It can also be used to develop process step estimated yield – the expected percentage of assemblies with no defects for a particular process step or combined process steps, based on historical defect rates.
IPC 9261
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In-Process DPMO and Estimated Yield for PWAs
Association Connecting Electronics Industries , 03/01/2002
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