This specification establishes uniform methods to increase electronic, electrical, or electromechanical product reliability by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to components within the system.
The purpose of this standard is to improve electronic, electrical, or electromechanical product reliability by deliberately operating components at applied stress levels (i.e., voltage, current, temperature, power, etc.) that are less than the component is rated for.
New IEEE Standard – Active – Draft. This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.
The purpose of this standard is to improve electronic, electrical, or electromechanical product reliability by deliberately operating components at applied stress levels (i.e., voltage, current, temperature, power, etc.) that are less than the component is rated for.
New IEEE Standard – Active – Draft. This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.
