ATIS T1.TR.48-1996 pdf

ATIS T1.TR.48-1996

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Test Patterns for DS0 and Synchronous Digital Data Circuits

The Alliance for Telecommunications Industry Solutions , 06/01/1996

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Standard By:The Alliance for Telecommunications Industry Solutions , 06/01/1996
Published:06/01/1996
File Size:1 file , 34 KB
Language:English
Note:This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus
This report documents the various test patterns used to qualify and troubleshoot both DS0 and Synchronous Digital Data Circuits.

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